Real-space overlap is not enough: ambiguity in nanobeam iterative ptychography

High-resolution iterative ptychography typically relies on a well-aligned, high-convergence-angle electron probe.

High-resolution iterative ptychography typically relies on a well-aligned, high-convergence-angle electron probe. Here we explore whether it can instead be performed at small convergence angles, relaxing the need for probe correctors and enabling experiments at low accelerating…