Overcoming Data Scarcity and Confidentiality in Hardware Assurance via Synthetic Generation

Hardware assurance relies on scanning electron microscopy (SEM) to verify nanoscale structures, but assembling the large, high-quality datasets required for automated analysis is impeded by time-intensive acquisition and strict intellect…

Hardware assurance relies on scanning electron microscopy (SEM) to verify nanoscale structures, but assembling the large, high-quality datasets required for automated analysis is impeded by time-intensive acquisition and strict intellectual property (IP) constraints on…